metrization and sigma bases

dc.contributor.advisor	whitfield, john
dc.contributor.author	hansen , lawrence david
dc.date.accessioned	2009-11-24t20:16:42z
dc.date.available	2009-11-24t20:16:42z
dc.date.created	1969
dc.date.issued	1969
dc.identifier.uri	http://knowledgecommons.lakeheadu.ca/handle/2453/33
dc.description	1969	en_us
dc.description.abstract	in this thesis, we use the concept of sigma base to study the metrizability of various topological spaces. chapter 1 is devoted to the definition of basic terms, a proof of urysohn's metrization theorem, and an introduction to sigma structures.	en_us
dc.language.iso	en	en_us
dc.subject	metrization	en_us
dc.subject	sigma bases	en_us
dc.title	metrization and sigma bases	en_us
dc.type	thesis	en_us
etd.degree.name	master of arts	en_us
etd.degree.level	master	en_us
etd.degree.discipline	mathematical sciences	en_us
etd.degree.grantor	阿根廷vs墨西哥竞猜	en_us
dc.contributor.committeemember	eames, william