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dc.contributor.advisormackinnon, craig
dc.contributor.authorkelly, kaitlyn t.
dc.date.accessioned2015-06-15t20:20:22z
dc.date.available2015-06-15t20:20:22z
dc.date.created2015
dc.date.issued2015-06-15
dc.identifier.urihttp://knowledgecommons.lakeheadu.ca/handle/2453/638
dc.description.abstractpresented herein is the organic synthesis and thin film (tf) assembly of six alkyl-substituted thiocyante and selenocyante bithiophene molecules: ncse-t2-hx, ncs-t2-hx, ncs-hx-t2-hx, ncse- hx-t2-hx, ncs-hx-t2-hx-scn and ncse-hx-t2-hx-secn. tfs assembled from these thio and selenocyanates were characterized by six different techniques: electrochemical capacitance (cp) measurements, scanning electron microscopy (sem), energy dispersive x-ray spectroscopy (edx), atomic force microscopy (afm), x-ray photoelectron spectroscopy (xps) and time-of-flight secondary ion mass spectrometry (tof-sims). cp experiments were used to confirm the development of tfs on an amorphous au surface using ethanol or hexanes as a reaction solvent. a sputtered au surface was observed by sem/edx to be an inappropriate surface for tf assembly. tfs assembled onto epitaxially grown au were characterized by multiple techniques. large crystallites were observed on tfs assembled from ncse-t2-hx and ncse-hx-t2-hx-secn. chemical maps of these crystallites were obtained through sem/edx. the presence of a covalent au-s or au-se bond on the surface was confirmed by xps signals from the s 2p3/2 and se 3d5/2/3d3/2 regions respectively. xps signals of ~ 399 ev in the n 1s region were observed in all assemblies characterized by this technique, indicating the presence of residual gold-bound cyanide (au(cn)ads) on the surface. tof-sims chemical intensity maps confirmed the presence of expected tf fragments on the surface of all tfs characterized by this technique. tof-sims results suggested that tfs connected to the au surface through an aromatically bound s or se atom produced tfs with higher surface coverage.en_us
dc.language.isoen_usen_us
dc.subjectthiolate thin filmen_us
dc.subjectdevelopment of thiocyanate precursorsen_us
dc.subjectsurface analysis techniquesen_us
dc.subjectatomic force microscopy (afm)en_us
dc.subjectscanning electron microscopy and energy dispersive microscopy (sem/edx)en_us
dc.subjectx-ray photoelectron spectroscopy (xps)en_us
dc.subjecttime-of-flight secondary ion mass spectrometry (tof-sims)en_us
dc.titleself-assembled thin films of thiocyanate and selenocyanate bithiophenesen_us
dc.typethesisen_us
etd.degree.namem.sc.en_us
etd.degree.levelmasteren_us
etd.degree.disciplinechemistryen_us
etd.degree.grantor阿根廷vs墨西哥竞猜 en_us
dc.contributor.committeememberchen, aicheng
dc.contributor.committeemembergottardo, christine
dc.contributor.committeememberylijoki, kai


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